Speaker

Said Hamdioui

Delft University of Technology (TU Delft, the Netherlands)

Said Hamdioui, Delft University of Technology (TU Delft, the Netherlands), is speaking at IEEE 35th Asian Test Symposium (ATS 2026) (Kaohsiung, Taiwan, 1–3 Dec 2026) in the session “Tutorial 1: When Conventional Tests Go Blind: Device-Aware Test for Tomorrow’s Chips”.

Conferences: 1
Keynotes: 0
Upcoming: 1

Upcoming appearances

IEEE 35th Asian Test Symposium (ATS 2026)
1–3 Dec 2026Kaohsiung, Taiwan
- SpeakerTutorial 1: When Conventional Tests Go Blind: Device-Aware Test for Tomorrow’s Chips

More speakers at IEEE 35th Asian Test Symposium (ATS 2026)

Michael Campbell
Qualcomm Technologies, Inc.
Wu-Tung Cheng
National Tsing Hua University, Taiwan
Adam Cron
Synopsys
Sandeep Kumar Goel
Taiwan Semiconductor Manufacturing Company (TSMC), San Jose, CA
Clark Liu
MJC
Nilanjan Mukherjee
Siemens EDA

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