IEEE 35th Asian Test Symposium (ATS 2026)

Tong-Yu Hsieh - Technical Program Committee Chair, National Sun Yat-sen University

Satyadev Ahlawat - Indian Institute of Technology Jammu Mangesh Amdekar - NVIDIA Masayuki Arai - Nihon University Xiaole Cui - Peking University Patrick Girard - LIRMM, CNRS/University of Montpellier Dimitris Gizopoulos - National and Kapodistrian University of Athens Sybille Hellebrand - Paderborn University Yoshinobu Higami - Ehime University Michael Hsiao - Virginia Tech Chun-Lung Hsu - National Central University Chih-Tsun Huang - National Tsing Hua University Shi-Yu Huang - National Tsing Hua University Zhengfeng Huang - Hefei University of Technology Hideyuki Ichihara - Hiroshima City University Tomoo Inoue - Hiroshima City University Noor-Ain Kamsani - Universiti Putra Malaysia Haruhiko Kaneko - Institute of Science Tokyo Saqib Khursheed - University of Liverpool Haruo Kobayashi - Gunma University Erik Larsson - Lund University Chien-Mo Li - National Taiwan University Huawei Li - Institute of Computing Technology, Chinese Academy of Sciences Shu-Min Li - National Sun Yat-sen University Xiaowei Li - Institute of Computing Technology, Chinese Academy of Sciences Shyue-Kung Lu - National Taiwan University of Science and Technology Baolei Mao - Zhengzhou University Soumya Mittal - Qualcomm Technologies Inc. Thulasiraman Nandhakumar - University of Nottingham Malaysia Satoshi Ohtake - Oita University Chia-Yee Ooi - Universiti Teknologi Malaysia Alex Orailoglu - University of California, San Diego Matteo-Sonza Reorda - Politecnico di Torino Kewal Saluja - University of Wisconsin-Madison Hiroshi Takahashi - Ehime University Jaynarayan-T Tudu - Indian Institute of Technology Tirupati Jerzy Tyszer - Poznan University of Technology Senling Wang - Ehime University Xiaoqing Wen - Kyushu Institute of Technology Dong Xiang - Tsinghua University Mingfu Xue - East China Normal University Aibin Yan - Hefei University of Technology